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Materials and Device Characterization

  Materials and Device Characterization
  We offer access to a wide range of characterization techniques for materials and devices; optic microscopy, high resolution scanning and transmission electron microscopy, x-ray diffraction, scanning probe techniques and a variety of electric, optic and magnetic characterization of materials, structures and devices.
 
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 NameManufacturerModel
DetailsEmpyreanPANalytical B.V.Empyrean multipurpose high resolution X-ray diffra
DetailsRaman Spectrometer HORIBA iHR 550HORIBA Jobin YvoniHR 550
DetailsUHV SPM 3500RHK TechnologyUHV SPM 3500
DetailsSTM 1OmicronOmicron STM-1
DetailsVT STMOmicronOmicron VT-STM
DetailsBond Tester DAGEDAGE2400PC
DetailsAFM/SPM Nanow.JPK2 AlbanovaJPK InstrumentsNanowizard 3
DetailsOpt. micr. 4, fluorescence, AlbanovaNikonME600 w. fluorescence unit
DetailsOpt. micr. 3, AlbanovaNikonEclipse L200
DetailsOpt. micr. 2, AlbanovaNikonME600
DetailsOpt. micr. 1, AlbanovaNikonME600
DetailsProbestation 4 High Temp.SignatoneS-1060
DetailsSPM/AFM Nanowizard JPK AlbanovaJPK InstrumentsNanowizard 3 Bioscience AFM
DetailsSPM/AFM FastScan AlbanovaBrukerDimension FastScan
DetailsFTIR SpectrometerBrukerVortex 70 V
DetailsCryogenic ProbestationJanisST-500-UHT
DetailsSPM/AFM Icon AlbanovaBrukerDimension Icon
DetailsScanning near-field optical microscope (SNOM)Max Born Institute with modifications at KTHA home-made instrument
DetailsTesttool ELABElectrum labmodel 1
DetailsBaltazar spectrometerSPECS GmbH and homemadeHomemade
DetailsM14 Olympus/cameraOlympusBX60
DetailsProfiler AlbanovaKLA-TencorP15
DetailsSPM/AFM Multimode AlbanovaBruker (formerly Veeco) Multimode Nanoscope IV
DetailsFIB/SEM AlbanovaFEI CompanyNova 200
DetailsLaboratory ovenHereausBench oven
DetailsM20 MicroscopeNanometricsMicroscope
DetailsIon polishingGatanPrecision ion polishing 691
DetailsElectrolyte polishingFischioneElectrolyte polishing
DetailsDimple grinderGatanDimple grinder
DetailsUltrasonic disc cutterGatanModel 601
DetailsGrinder-polisherBuehlerVector/Alpha
DetailsDiamond sawBuehlerIsomet low speed saw
DetailsGold sputter FNMJEOLIon sputter JFC-1100
DetailsPlasma cleanerFischionePlasma cleaner
DetailsCD SEMHitachiS-3400N & EDS QUANTAX 200
DetailsElectroglasElectroglas2001X
DetailsUVISELHORIBAUVISEL ER
DetailsPreparation labCollection of toolsTools for sample preparation
DetailsSQUID-VSMQuantum DesignUtlrasensitiv magnetometer
DetailsNetwork AnalyzerAgilentPNA 110 GHz
DetailsProbestation 3 Semi AutomaticCascade MicrotechCascade 12000
DetailsCIPTSmartipCIPTech
DetailsHF ProbestationIn-houseHigh Field RF Characterization Station
Details3D MF ProbestationIn-houseMedium Field MR and RF Probe Station
Details4-PointFour Dimensions, IncModel 280
DetailsMS02 NikonNikonStereo microscope SMZ-2T
DetailsKemvåg??
DetailsMS01 NikonNikonStereo microscope SMZ-2B
DetailsM09 Nikon/cameraNikonMicrosocpe with camera
DetailsM08 Leitz/cameraLeitzMicroscope with camera
DetailsCanon EOS 350DCanonEOS 350D 100mm Macro
DetailsM13 Nikon/cameraNikonNikon
DetailsAGMPrinceton Measurement Corporation2900-02 Alternating Gradient Magnetometer
DetailsHallVarian/KeithlyIn-house
DetailsAFM/SSRMVeeco/Digital InstrumentsNanoScope Dimension 3100
DetailsOptical profilometerVeecoWyko NT9300
DetailsManual probstationSuss Microtech10500006 (probe station)
DetailsFIB-SEMFEIQUANTA 3D FEG
DetailsFE-TEMJEOLJEM 2100F(HR), JEOL Electron Microscope 2100 Field
DetailsProbestation 2 High VoltageCascade8-inch manual
DetailsProbestation 1 ManualCascade11000
DetailsPrometeus manualKarl Suss and Temptronic TermoChuck SystemManual Probestation PM 5, TP0314A
DetailsFTP500FTPInterferometer
DetailsM10 Nikon/autoNikonMicroscope (motorized objectives)
DetailsDektakSTDektak3ST
DetailsAFM AcreoDigital Instruments (Veeco)Atomic Force Microscope
DetailsPrometeus autoKarl Suss and Temptronic TermoChuck SystemAutomatic Probestation PA 150 and TP03215B-3300-2
DetailsM07 Olympus/cameraOlympusMicroscope
DetailsM05 Nikon/autoNikonMicroscope
DetailsM04 LeitzLeitzLABORLUX 12 HL
DetailsUVO CleanerJelight COmpany, Inc42-220
DetailsM03 LeicaLeicaMicroscope
DetailsM02 Olympus/cameraOlympusBX60
DetailsSkivthkMitutoyoRDP transducer indicator E307-1
DetailsLEITZLEITZ MPV-SPThin film interferometry,
DetailsM11 Nikon/CD 1NikonOPTISHOT/Linjebreddsmätare
DetailsM01 OlympusOlympusBX60M
DetailsPL mappingPhilipsCQL7840/D
DetailsnSPECNikonNiklas
DetailsHR X-RayX-RayX-Ray
DetailsGeminiZeiss Ultra 55
DetailsTencorTencorSurface profiler Tencor-P10