Materials and device characterization

Our characterization laboratories are equipped with world class tools, covering all techniques necessary to characterize the wide range of materials and devices handled in the process lines.

We offer conventional optic and electron microscopy. State-of-the-art x-ray characterization gives accurate information of crystal lattices and structures. Atomic composition and chemical properties are determined through highly sensitive analysis of ion masses and electron energies. Various scanning probe techniques – some of them unique – provide electric, atomic and optic information down to nanometer scale. Optical measurements are performed over a broad spectral range and ultra fast processes are studied.

Devices are characterized by advanced electrical testing up to extremely high frequencies and high powers at voltages and current ranges covering orders of magnitude. Highly accurate capacitance and noise measurements are performed. Optoelectronic devices, including light emitting diodes, lasers and detectors are readily characterized with respect to wavelength, high frequency response, output power and efficiency.